by Jianwei Zhang, William G.J. Halfond and Sandeep Gupta
Reference:
A new method for software test data generation inspired by D-algorithm. Jianwei Zhang, William G.J. Halfond and Sandeep Gupta. In Proceedings of the IEEE VLSI Test Symposium (VTS). April 2019.
Bibtex Entry:
@InProceedings{zhang19vts,
Title = {A new method for software test data generation inspired by D-algorithm},
Author = {Jianwei Zhang and William G.J. Halfond and Sandeep Gupta},
Booktitle = {Proceedings of the IEEE VLSI Test Symposium (VTS)},
Year = {2019},
Month = {April},
Acceptancerate = {},
Keywords = {testing},
Pubtype = {Conference}
}